TTEP Tutorials at ITC 2007 - Call for Participation

CALL FOR PARTICIPATION

Overview -- TTEP Tutorials at ITC 2007 -- TTTC Tutorials and Education Group

Overview

The Tutorials & Education Group of the IEEE Computer Society Test Technology Technical Council (TTTC) presents a comprehensive set of sixteen full-day tutorials on topics of current interest to test professionals and researchers at ITC Test Week 2007 in Santa Clara, California. All tutorials qualify for credit towards IEEE TTTC certification under the TTEP program. Eight tutorials will be held on Sunday, October 21st, and eight on Monday, October 22nd. The titles of tutorials are listed below.

For more details and registration information on the 2007 ITC/TTEP tutorials see the ITC Test Week 2007 Advance Program and Registration on www.itctestweek.org.

Advance registration deadline is September 24. Admission for on-site registrants is subject to availability. For further information regarding TTEP annual tutorials program, please visit:

http://tab.computer.org/tttc/teg/ttep/

TTEP Tutorials at ITC 2007

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TUTORIALS 1 to 8 Sunday, Oct. 21, 8:30 a.m. - 4:30 p.m.
TUTORIAL 1	NEW
DFX: The Convergence of Yield, Manufacturing, and Test Presenters: R. Aitken
TUTORIAL 2	NEW
Delay Testing: Theory and Practice Presenter: N. Tendolkar, S. Patil
TUTORIAL 3	UPDATED
Statistical Screening Methods Targeting “Zero Defect” IC Quality and Reliability Presenter: A. Singh
TUTORIAL 4	UPDATED
Dealing with Timing Issues for Sub-100n Designs — >From Modeling to Mass Production Presenters: Li-C. Wang, M. Abadir
TUTORIAL 5	UPDATED
Practices in Analog, Mixed-signal, and RF Testing Presenter: S. Abdennadher, S. Shaikh
TUTORIAL 6	UPDATED
Test Strategies for System-in-Package Presenters: Y. Zorian
TUTORIAL 7	UPDATED
Memory Test Challenges — A Practical and Implementation View of BIST and Other DFT Techniques Presenters: V. Jayaram, S. Lai
TUTORIAL 8	UPDATED
Digital Timing Measurements — From Scopes and Probes to Timing and Jitter Presenters: W. Maichen
TUTORIALS 9 to 16 Monday, Oct. 22, 8:30 a.m. - 4:30 p.m.
TUTORIAL 9	NEW
IEEE 1500 – Building a Compliant Wrapper Presenters: T.McLaurin, F.Da Silva, T.Waayers
TUTORIAL 10	NEW
Delay Test: A Practical Approach Presenters: A. Cron, B. Kruseman
TUTORIAL 11	UPDATED
Advanced Memory Testing Presenter: A. van de Goor
TUTORIAL 12	NEW
Scan Compression Techniques: Theory and Practice Presenters: R. Parekhji, T. Williams, R. Kapur, J. Abraham
TUTORIAL 13	UPDATED
Wafer Probe Test Technology Presenter: W. Mann, J. Broz
TUTORIAL 14	UPDATED
Design for Manufacturability Presenters: Y. Zorian, J.A. Carballo
TUTORIAL 15	UPDATED
Understanding Failure Mechanisms and Test Methods in Nanometer Technologies Presenter: J. Segura, C. Hawkins
TUTORIAL 16	UPDATED
Design for Testability for RF Circuits and Systems Presenters: M. Margala, S. Osev

TTTC Tutorials and Education Group

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Chair
Dimitris Gizopoulos
University of Piraeus

Vice Chair (Organization)
Anand Raghunathan
NEC Labs

Vice Chair (Program)
Kaushik Roy
Purdue University

Planning
V. Agrawal, Auburn University
G. Robinson

Communications
M. Hsiao, Virginia Tech.

Industry Relations
R. Aitken, ARM

Finance
M. Nicolaidis, TIMA Laboratory

Initiatives – New Topics
B. Courtois, TIMA

Publicity
Y. Makris, Yale University
C. Metra, University of Bologna

Audio/Visual
S. Menon, Intel

Electronic Media
G. Xenoulis, U. of Piraeus

Organizing Liaisons
U. Arz, PTB
V. Champac, INAOE
I. Ghosh, Fujitsu
H. Li, Chinese Acad. of Sciences
Z. Peng, Linkoping U.
M. Psarakis, Piraeus U.
J. Segura, U. Illes Balears

Program Committee
V.D.Agrawal, Auburn U.
T.Aikyo, STARC
R.Aitken, ARM
D.Appello, ST Microelectronics
U.Arz, PTB
S.Bhunia, Case West. U.
K.Butler, Texas Instruments
S.Chakravarty, Cswitch
V.Champac, INAOE
S.Davidson, Sun
J.Figueras, UPC Barcelona
A.Gattiker, IBM
P.Harrod, ARM
K.Hatayama, STARC
D.Josephson, Intel
H. Li, Chinese Acad. of Sciences
H.Manhaeve, Q-Star
A.Paschalis, U. of Athens
Z.Peng, Linkoping U.
A.Raghunathan, NEC Labs
R.Raina, Freescale
J.Rajski, Mentor Graphics
G.Roberts, McGill U.
M.Slamani, IBM
B.West, Credence
D.Wheater, IBM
H.-J.Wunderlich, U. Stuttgart

For more information, visit us on the web at: http://tab.computer.org/tttc/teg/ttep

The Test Technology Educational Program 2007 (TTEP 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).